*)N.B. if there are students who do not speak Portuguese the language is English.
This curricular unit aims at providing the students with a number of technical skills for the characterisation of materials, including those related to sample preparation and the most common analytical techniques in Condensed Matter Physics reserch (materials characterisation with regard to structure, microstructure, electric, optical and magnetic properties). Learning of such skills will take place in the context of research laboratories.
Techniques for structural analysis: X-ray diffraction (XRD), electron and neutron diffraction by single crystals and polycristalline materials. Small-angle scattering (SAXS). Analysis of microstructure, textures and residual stresses.
Spectroscopic techniques: VIS/UV, IR and Raman spectroscopies.
Nuclear methods: Mossbauer and muon spectroscopies. Nuclear magnetic resonance (NMR).
Thermometric methods: DSC, DTA and DTG. Measurement of specific heat.
Techniques for elementar and trace analysis: Xray fluorescence spectroscopy (XRF), mass spectroscopy and EDS.
Imaging techniques: electron microscopy (SEM, TEM), atomic force and scanning tunnel microscopies (AFM/STM).
Characterisation of electric transport properties and magnetism: DC and AC resistivity, magnetoresistance, Hall effect, magnetometry.
Basic knowledge in Condensed Matter Physics
Generic skills to reach
. Competence in analysis and synthesis; . Competence for working in group; . Competence in autonomous learning; . Competence in applying theoretical knowledge in practice; . Research skills; . Competence in organization and planning; . Competence in oral and written communication; . Competence to communicate with people who are not experts in the field; . Adaptability to new situations; . Creativity; (by decreasing order of importance)
Teaching hours per semester
total of teaching hours
Laboratory or field work
Bibliography of reference
Elements of Modern X-Ray Physics, J. Als-Nielsen, D. McMorrow, Wiley. ISBN: 0470973943
Modern electronic instrumentation and measurement techniques, Albert D. Helfrick, William D. Cooper, ISBN: 0135932947
Practical guide to ICP-MS: a tutorial for beginners, Robert Thomas, ISBN: 1466555432
Infrared Spectroscopy, fundamentals and applications, Barbara Stuart, ISBN 9780470854280
X-ray fluorescence spectroscopy and related techniques; an introduction, Eva Margui, Rene Van Grieken, ISBN: 9781606503911
Introduction to X-ray powder diffractometry, Ron Jenkins, Robert Snyder, ISBN: 0471513393
Atomic force microscopy, Peter Eaton, Paul West, ISBN: 9780199570454
The handbook of cryogenic engineering, J.G. Weisend, ISBN: 1560323329
Scanning electron microscopy and X-ray microanalysis, Joseph Goldstein, Dale E. Newbury, David C. Joy and Charles E. Lyman, ISBN-10: 0306472929
The different topics will be presented in seminars covering the variety of analytical techniques. Learning will take place mostly in the laboratory, where the students will perform a set of practical work assignments. Most of the work will take place at TAIL - UC (Trace Analysis and Imaging Laboratory of the University of Coimbra), hosted at the Physics department, where most of the analytical techniques are available and at other laboratories of the UC Physics and Chemistry departments.
Laboratório de Física da Matéria Condensada; Laboratórios de Investigação dos Departamentos de Física e de Química da FCTUC